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Topic: Re: RE: Exam
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Al Coons

Posts: 57
Registered: 12/6/04
Re: RE: Exam
Posted: May 8, 1997 8:13 AM
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l.godbold@mail.comap.com,Internet writes:
>Interesting. I would argue the other side of the coin (chip?). I'm
>not sure
>what "independent" means here, but it seems reasonable to believe that
>the
>batches constitute "matched pairs" in that they are processed during
>the same
>hour. That is, if flaws are due to pre-baking production problems,
>those
>baked in the same hour should be essentially the same due to the random
>assignment to the ovens, but hour-to-hour flaws may vary due to
>pre-baking
>problems. Thus, I favor the 1-t test, if a t-test is to be used, or
>the Sign
>Test for a nonparametric solution.


I was about to offer the same idea. I think students should get credit
either way as long as make a reasonable argument for the choice they
make.

Al oons





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